Laser Diffraction - Mastersizer 2000 Optical System

$Malvern Instruments particle size analysis products apply advanced technologies such as laser diffraction, Zeta potential measurement, Non-Invasive Back-Scatter optics, and Image analysis$

More information:
	Mastersizer 2000
	Laser Diffraction
	Laser Diffraction Particle Sizing
	Analysing Light Scattering Data
	What is Particle Size?
	Comparing Different Particle Sizing Techniques


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	Mastersizer 2000 Optical System


	At the core of the Mastersizer 2000 is its optical bench, design to yield reproducible measurements over a wide particle size range, without the need for constant user interventions and adjustments. Wide Angular Range: The Mastersizer 2000 system was the first system to provide for continuous detection from 0.01 degrees to beyond 130°. This ensures that broad size distributions covering a 0.02-2000 micron range can be routinely characterised without endless lens changes and the splicing of results from different measurements. Dual-Wavelength Detection: The Mastersizer 2000’s patented blue-light detection system is used in conjunction with a traditional red light source, yielding unparalleled submicron measurement performance. Logarithmic Detector Array: The angle sampled by each detector in the Mastersizer 2000 increases logarithmically as the angle increases, optimising the sensitivity to changes in both the coarse and fine particle fraction. Reverse Fourier Optics: The ability to measure particle scattering accurately at both forward and backscatter angles is achieved by placing the focusing lens before the sample cell. This yields a measurement dynamic range that is impossible to achieve using simple Fourier lens systems. Cell Cassette System: Provides for the reproducible positioning of the measurement cell yielding accurate results. This also allows users to quickly swap the cell and configure the system for differed dispersion units. Rapid Auto-alignment: allows the optics alignment to be checked and adjusted in a few seconds. The optical alignment is therefore optimised at the beginning of each measurement ensuring accurate results are obtained. At each stage of the measurement, the requirements of ISO13320, the international standard for laser diffraction measurements, are met in full. This has delivered a system which can be applied in diverse applications, from fundamental research where high sensitivity is required through to QC application where rapid sample through-put is essential.