Particle Size History Display

Spray systems are often dynamic in nature. They can involve the formation of droplets over very short timescales or, in the case of continuous atomisers, there can be fine temporal fluctuations in the spray output relating to the way particle formation and dispersion occurs. The Spraytec’s unique Particle Size History display enables researchers to easily observe both long and short-term changes in the spray particle size, allowing the dynamics of atomisation to be better understood.

The Particle Size History display provides:

• Frame-by-frame analysis: A size history chart displays changes in the key size distribution parameters as a function of time. The parameters shown can be configured by the user. By clicking on the chart, users can also instantly display the recorded particle size distribution for each measurement point.
• Spray Event Playback: Users can scan backwards and forwards through the data displayed on the size history chart, providing an instantaneous playback of the changes observed in the size distribution.
• Drag-and-Drop Record Selection: Records can easily be selected for further data analysis, averaging or data export using a simple drag-and-drop interface.
• Zoom Facility: Users can select regions of the size history chart and automatically zoom in to examine the short-term variations in the measured droplet size.
• Measurement Diagnostics: Key measurement events, such as measurement triggers, are displayed on the size history chart, allowing methods to be optimised for different conditions.

Key to screen shot:

1: Size History Cart: shows how key result parameters vary as a function of time.
2: Record Selector: This yellow selector bar can be positioned anywhere on the size history graph, allowing the data captured at each measurement point to be viewed.
3: Record Views: 2 views showing the data recorded at the time relating to the position of the selector bar on the size history chart. Users can select to view the recorded size distributions, derived parameter tables, scattering data, measurement SOP parameters and other diagnostic reports.